Electron microscopy: scientific half-day on May 30

The electron microscopy cluster of the Advanced Characterization Platform is organizing a half-day of scientific exchanges on May 30, starting at 1:30pm in the Chevreul building.

Program:

A first session devoted to various aspects of diffraction (EBSD, orientation mapping, 4D-STEM).

A second session, open to all subjects and inviting contributions. Staff and students who have worked on the cluster, using SEM or TEM, are invited to present their results. All you need to do is send an indicative title and a few keywords by May 15 to Corentin Le Guillou (corentin.le-guillou@univ-lille.fr) and Maya Marinova (maya.marinova@univ-lille.fr).

Information and registration (mandatory) on the dedicated page.