A new diffractometer for the advanced characterisation platform
The X-Ray Diffusion and Diffraction Pole of the Chevreul Institute’s advanced characterisation platform has just welcomed a latest-generation diffractometer equipped with a rotating anode source and a hybrid pixel detector. This very high sensitivity equipment enables the analysis of small quantities of materials (solid or powdered polycrystalline) and kinetic studies to be carried out under different environments. This remarkable equipment has been financed within the framework of the CPER ARCHI-CM project.
The ARCHI-CM project is led by the Chevreul Institute and is financed by the Région, l’Europe, l’Etat et le CNRS.